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項(xiàng)目 Item |
技術(shù)要求 Technical Specification |
測試方法和備注 Test Method and Remarks |
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容量Capacitance (C) |
I類Class I |
應(yīng)符合指定的誤差級別 within the specified tolerance. |
標(biāo)稱容量 Capacitance |
測試頻率Measuring Frequency |
測試電壓Measuring Voltage |
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≤1000pF |
1MHZ±10% |
1.0±0.2V |
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＞1000 pF |
1KHZ±10% |
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II類Class II |
應(yīng)符合指定的誤差級別 within the specified tolerance. |
對于Ⅱ類電容器，測試前應(yīng)先預(yù)處理 The capacitance should be pretreated before measured(only for classⅡ). |
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測試頻率Measuring Frequency |
測試電壓 Measuring Voltage |
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1KHZ±10% |
B: 1.0±0.2V |
E/ Y( F) 0.3±0.2V |
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損耗角正切Dissipation Factor (DF) |
I類Class I |
CR≥50pF DF≤0.15% CR＜50pF DF≤1.5[(150/CR)+7] X10-4 |
標(biāo)稱容量 Capacitance |
測試頻率Measuring Frequency |
測試電壓Measuring Voltage |
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≤1000pF |
1MHZ±10% |
1.0±0.2V |
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＞1000 pF |
1KHZ±10% |
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II類Class II |
B |
DF ≤3.5% |
測試頻率: 1KHZ±10%; 測試電壓: 1.0±0.2V Measuring Frequency Measuring Voltage |
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E/ Y (F) |
≤7.5% (CR ≤ 0.1uF) ≤10.0% (1uF ＞ CR ＞ 0.1uF) ≤15% (CR ≥1uF) |
測試頻率: 1KHZ±10% Measuring Frequency 測試電壓:0.3±0.2V Measuring Voltage |
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絕緣電阻Insulation Resistance |
I類Class I |
C≤10nF IR≥10000MΩ C>10nF R.C≥100 ΩF |
測試電壓:額定電壓 Measuring Voltage: Rated Voltage 測試時間: 60±5秒Duration: 60±5s |
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II類Class II |
C≤25nF IR≥4000MΩ C>25nF R.C≥100 ΩF |
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